Low Resolution RIXS: A versatile Spectroscopic Tool for Chemical State Assessments

ROBLEDO J. I.; LEANI J. J.; SÁNCHEZ J. H.

Conferencia; International Forumb on Advances in Radiation Physics; 2017

In X-ray fluorescence analysis, spectra present singular characteristics produced by thedifferent scattering processes. When atoms are irradiated with incident energy lower butclose to an absorption edge, scattering peaks appear due to an inelastic process knownas Resonant Inelastic X-ray Scattering (RIXS) or X-ray Resonant Raman Scattering(RRS) [1]. These RIXS/RRS peaks present a series of particular features; betweenthem, a characteristic long- tail spreading to the region of lower energies. It has beenrecently observed that, hidden on this tail, there is valuable information about the localenvironment of the atom under study [2].During the last five years, several works have been shown the first applications ofRIXS (or RRS) for the discrimination, determination and characterization of chemicalenvironments in a variety of samples and irradiation geometries and even combinedwith other spectroscopic techniques [3-8]. One of the most important features of theexperimental setup reported in these works is the use of an energy dispersive lowresolutionspectrometer for measuring the RIXS spectra.In this presentation, the basis, advantages, general highlights and latest applicationsof this novel and versatile tool for chemical state determinations will be presented anddiscussed.