Structural study of halogenated pi-conjugated systems using X-ray single-crystal diffraction

A. T. PIOTTO; G. PUNTE; G. ECHEVERRÍA; C. POZZI

Córdoba

Congreso; I Reunión Latinoamericana de Cristalografía y IX Reunión de la AACr.; 2013

Engineering materials has attracted considerable activity in the study of crystalline properties of pi-conjugated halogenated fluorene because of their potential semiconducting properties when organized in polymers and their application in optoelectronics. The structural study of the compounds 9-(p-iodo-benzyliden)-2,7-bis-phenyl-ethinyl-9-H-fluorene (1) and 9-(p-iodo-benzyliden)-9H-fluorene (2) by employing diffraction Single-Crystal X-Ray Diffraction has been performed and the results are presented below. The modification of the geometric parameters of fluorenic fragment by including substituents at the 2, 7 and 9 carbon atoms positions as well as their interactions are described and discussed.