K-S Relationship identification technique by EBSD

MC MARINELLI; MG MOSCATO; J SIGNORELLI; A EL BARTALI; I ALVAREZ

KEY ENGINEERING MATERIALS

Trans Tech Publications

Año: 2011 vol. 465 p. 415 - 418

1013-9826

This paper focuses on the identification of activated slip system in flat specimens of hotand cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of á/ã grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.