Synchrotron X-ray characterization of haemocompatible TiO2 nano-films

CARLOS ENRIQUE SCHVEZOV; MIGUEL ANGEL ALTERACH; MARIA LAURA VERA; MARIO ROBERTO ROSENBERGER; ALICIA ESTHER ARES; DIEGO GERMAN LAMAS

Beijing

Conferencia; The 16th International Conference on Crystal Growth(ICCG-16); 2010

International Organization for Crystal Growth

TiO2 films with good haemocompatibility should have a mixed crystalline structure including rutile andanatase. In the present report the results of the characterization of nano-films between 20 nm-140 nm thickusing synchrotron radiation are presented. The films were produced on grade 5 Titanium by the sol-geldeposition technique and by anodic oxidation. Thicknesses of TiO2 films were determined by X-rayreflectometry technique and crystalline structures were determined by X-ray diffraction technique. The resultsshowed a relation between thickness and structure which depends on the deposition technique. In the thinnestfilms no crystal structure is detected. In the sol-gel and thermal oxidation technique as the thickness of filmsincreases rutile is detected first. In anodic oxides anatase appears first. For thicker films both rutile and anataseare present. The brookite structure is not detected in any case. The results of the characterization are comparedwith the results obtained with a standard X-ray apparatus set in a glancing angle geometry