Development of a Radiographic Technique with Particle Microbeams

H. SOMACAL; A. BURLON; M. DEBRAY; A. KREINER; J. KESQUE; D. MINSKY

Villa Giardino, Córdoba. Presentación mural

Congreso; IX Seminario Latinoamericano de Análisis por Técnicas de Rayos X; 2004

Grupo de Espectroscopia Atómica y Nuclear, FAMAF, UNC

The use of microbeams of particles is well established and extended throughout the world in recent years. A number of analytical techniques are being utilized in these facilities like PIXE (Particle Induced X-ray Emission) and STIM (Scanning Transmission Ion Microscopy). The first technique allows the performance of multielemental analysis of samples and the second one gives densitometric information, both with 1 micometer spatial resolution. To characterize trace elements quantitatively it is necessary to combine both techniques. This is cumbersome, because it requires two independent experiments for each sample. PIXE needs high ion currents to enhance the production of X-rays and STIM low currents to spare the silicon surface barrier detector. In this work we introduce a new technique to perform densitometric and multielemental analysis of samples at the same time using only one detector. It consists in the simultanueoues analysis of the X-rays induced in the sample and its own radiography produced by an X-ray source induced in a secondary target arranged behind it. Selecting conveniently the secondary target, it is possible to distinguish the two sources. First experimental results are presented.