A Radiographic Technique with Heavy Ion Microbeams

MUSCIO, J.A; SOMACAL, H; BURLON, A.; DEBRAY, M.E.; DEBRAY, M.E.; KREINER, A.J.; KESQUE, J.M.; MINSKY, D.; VALDA, A.

Iguazú, Misiones. Presentación mural

Congreso; VI Latin American Symposium on Nuclear Physics and Applications; 2005

Dpto. de Física FCEN, UBA - Dpto. de Física UNLP – Lab. TANDAR, CNEA

The use of particle microbeams is well established and extended throughout the world. A number of analytical techniques are being utilized in these facilities like PIXE and STIM. The rest of these techniques allows the performance of multielemental analysis of samples and the second one gives densitometric information, both with about 1 micron spatial resolution. To characterize trace elements quantitatively it is necessary to combine both techniques. This is cumbersome, because it requires two independent experiments for each sample, with con icting requirements. PIXE needs high ion currents to enhance the production of X-rays induced, and STIM low currents, to spare the silicon surface barrier detector. In this work, we introduce a new technique to perform densitometric and multielemental analysis of samples at the same time using only one detector. It consists in the simultaneous analysis of the X-rays induced in the sample and its own radiography produced by an X- ray source induced in a secondary target arranged behind it. By selecting conveniently the secondary target it is possible to distinguish the two sources. With the aim of doing this selection we have studied dierent configurations of secondary targets by means of computer simulations. In this report these simulations are presented and compared to recent experimental results, obtained with the heavy ion microprobe at the Tandar Accelerator of the Argentine Atomic Energy Commission.