Thermal expansion recovery microscopy: Practical design considerations

N. MINGOLO; O.E. MARTÍNEZ

REVIEW OF SCIENTIFIC INSTRUMENTS

AMER INST PHYSICS

Lugar: American Institute of Physics; Año: 2014 vol. 85 p. 1 - 8

0034-6748

A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.