INVESTIGADORES
HUCK IRIART Cristian
artículos
Título:
Fullerene-silicon polymerization evidence
Autor/es:
EMILIANO J. DI LISCIA; HUCK-IRIART, CRISTIÁN; E.B. HALAC; MARIA REINOSO; HUGO A. HUCK
Revista:
Interdisciplinary Journal of Chemistry
Editorial:
Open Access Text
Referencias:
Año: 2017
ISSN:
2398-7537
Resumen:
We report experimental results for C60-Si deposition by simultaneous thermal vaporization of fullerene source and chemical vapor deposition from silane source. The samples were characterized by Scanning Electron Microscopy, Energy-dispersive X-ray spectroscopy, Micro-Raman spectroscopy, Wide-angle X-ray scattering, X-ray photoelectron spectroscopy and its thermal stability was studied, discussed and compared with pure C60 deposited by the same method. A crystalline material was obtained and results suggest that a polymerization of fullerenes bridged by silicon atoms was achieved.
