INVESTIGADORES
FAVRET Eduardo Alfredo
artículos
Título:
Variogram Characterization of the Length Scales of Topographic Patterns
Autor/es:
NESTOR FUENTES; EDUARDO FAVRET
Revista:
MICROSCOPY & MICROANALYSIS
Editorial:
Cambridge University Press
Referencias:
Año: 2006 vol. 12 p. 82 - 83
ISSN:
1431-9276
Resumen:
Many classical methods, like profile extraction along a surface to obtain a roughness value, give parameters most often used to characterize the surface geometry. But these parameters do not cover information on the range of length scales present in a topographic pattern. In consequence, the use of new methods for multi-length scale characterization is imposed. The Variogram method for the quantification of length scale-dependent topography is presented in this work and its results compared with a simple profile extraction of the sample surface. From a given set of windows of different sizes on a digitized image, the mathematical variance of the surface (σ2) is calculated. This parameter is then represented on a log-log plot as function of the area size (Lx.Ly). Intersections of different slopes in the plot give the typical lengths that characterize the surface.
