Measured Critical Resolved Shear Stress and Calculated Temperature and Stress Fields During Growth of CdZnTe

C. PARFENIUK; F. WEINBERG; I.V. SAMARASEKERA; C. SCHVEZOV; L. LI

JOURNAL OF CRYSTAL GROWTH

Published by Elsevier Science Publishers B.V. (North Holland Physics Publishing Division)

Lugar: Sara Burgerhartstraat 25. 1055 KV Amsterdam. Netherlands.; Año: 1992 vol. 119 p. 261 - 270

0022-0248

The critical resolved shear stress (CRSS) of Cd0.46 Zn0.04 Te0.50 was measured at elevated temperatures. The temperature and stress fields for vertical Bridgman growth of CdZnTe were calculated using finite element metho. The measured CRSS and the calculated shear stress are related to dislocation formation in the crystal, during growth.