INVESTIGADORES
RICCARDO Jose Luis
artículos
Título:
Characterization of asymmetric polysulfone membranes by atomic force microscopy
Autor/es:
NAZZARRO, M.; A.J. RAMIREZ PASTOR; RICCARDO J.L.; OCHOA A.; MARCHESE J.
Revista:
REVISTA MEXICANA DE FíSICA
Editorial:
SOC MEXICANA FISICA
Referencias:
Lugar: México; Año: 1998 vol. 44 p. 58 - 61
ISSN:
0035-001X
Resumen:
Atomic force microscopy (AFM) has been used to investigate the surface of ultrafiltration membranes. Surface structures of asymmetric (integrally skinned) membranes made from polysulfone were prepared following the traditional wet-phase inversion process. AFM was used to measure the root-mean-square of surface-tip distance, 17, as a function of the typical dimension of the scanned region, L. From AFM images, a method to determine the size of nodulesconstituing the membrane structure is shown. In this study, it was found that W, which is a natural measure of surface roughness, increases with molecular weight cutoff (MWCO) of membranes. Preliminary analysis addresses the relationship between surface roughness and permeability.