INVESTIGADORES
VIDAL ricardo Alberto
artículos
Título:
Application of Auger electron spectroscopy and principal component analysis to the study of the Pd/c-Si and Pd/a-Si interfases
Autor/es:
R. VIDAL; J. FERRÓN
Revista:
APPLIED SURFACE SCIENCE
Editorial:
Elsevier
Referencias:
Año: 1988 vol. 31 p. 263 - 276
ISSN:
0169-4332
Resumen:
The use of Auger electron spectroscopy and principal component analysis for the study of the Pd/c-Si and Pd/a-Si interfaces are discussed in combination with the target transformation technique to extract the spectra for unidentified compounds found in the depth profiling process. Our results reveal the existence of a Si-rich compound in both interfaces while we found that Pd2Si is spontaneously formed (i.e. without annealing) only at the Pd/a-Si interface.
