Morphology and thermal stability of AlF3 thin films grown on Cu(100)

RUANO, G.; MORENO-LÓPEZ, J.C.; PASSEGGI (JR.), M.C.G.; VIDAL, R.A.; FERRÓN, J.; NIÑO, M.A.; MIRANDA, R.; DE MIGUEL, J.J.

SURFACE SCIENCE

ELSEVIER SCIENCE BV

Lugar: Amsterdam, Holanda; Año: 2012 vol. 606 p. 573 - 579

0039-6028

The growth of ultrathin epitaxial layers of aluminum fluoride on Cu(100) has been studied by a combination of surface science techniques. Deposition at room temperature results in step decoration followed by the formation of dendritic two-dimensional islands that coalesce to form porous films. Ultrathin layers (up to 2 monolayers in thickness) are morphologically unstable upon annealing; de-wetting takes place around 430 K with the formation of three-dimensional islands and leaving a large fraction of the Cu surface uncovered. Films several nanometers thick, on the contrary, are stable up to ca. 730 K where desorption in molecular form sets on. The effect of electron irradiation on the AlF3 has also been characterized by different spectroscopic techniques; we find that even small quantities of stray electrons from rear electron beam heating can provoke significant decomposition of the aluminum fluoride, resulting in the release of molecular fluorine and the formation of deposits of metallic aluminum. These features make AlF3 an interesting material for spintronic applications.