Growth, thermal desorption and ion bombardment damage in C60 films deposited on Cu(111).

F. BONETTO; R. VIDAL; V. QUINTERO RIASCOS; C. BONIN; J. FERRÓN

Natal

Encuentro; XXXIX Brazilian Meeting on Condensed Matter Physics; 2016

Sociedade Brasileira de Fisica

Auger Electron Spectroscopy (AES) and Low Energy Electron Diffraction (LEED)were used to characterize the growth and thermal desorption of C60 on Cu(111). C60 films were grown by sublimation from a Knudsen cell at 350°C, placed in an ultrahigh vacuum chamber (UHV) (~10-9Torr). We estimated the best conditions to obtain low energy ion scattered spectra (LEIS) by measuring the irradiation damage produced by typical doses used in these experiments (~1014 iones/cm2). In order to analyze the potential damage of the sample by ion bombardment (2 , 4 and 8 keV H+, He+ and Ar+), we monitored the evolution of the characteristic plasmon due to π-bonds of the C60 molecule C atoms by Electron Energy Loss Spectroscopy (EELS). In addition, Auger spectra (AES) were taken before and after irradiation to characterize and quantify the damage. Our study shows that: C60 growths on Cu(111) layer by layer; the desorption of the first monolayer is different to the desorption of the other layers, remaining the first monolayer even when the substrate is heated up to 500°C and; damage by ion bombardment, at the used dose, was only detected when the sample was under Ar+ irradiation.