Synchrotron X-ray characterization of haemocompatible TiO2 nano-filmsCET

M. A. ALTERACH ; M. L. VERA; D. G. LAMAS ; M. R. ROSENBERGER ; C. E. SCHVEZOV ; A. E. ARES

Beijing, China

Conferencia; THE 16th INTERNATIONAL CONFERENCE ON CRYSTAL GROWTH (ICCG-16); 2010

ICCG-16

TiO2 films with good haemocompatibility should have a mixed crystalline structure including rutile and anatase. In the present report the results of the characterization of nano-films between 20 nm-140 nm thick using synchrotron radiation are presented. The films were produced on grade 5 Titanium by the sol-gel deposition technique and by anodic oxidation. Thicknesses of TiO2 films were determined by X-ray reflectometry technique and crystalline structures were determined by X-ray diffraction technique. The results showed a relation between thickness and structure which depends on the deposition technique. In the thinnest films no crystal structure is detected. In the sol-gel and thermal oxidation technique as the thickness of films increases rutile is detected first. In anodic oxides anatase appears first. For thicker films both rutile and anatase are present. The brookite structure is not detected in any case. The results of the characterization are compared with the results obtained with a standard X-ray apparatus set in a glancing angle geometry.