CARAM, JORGE; SENNO, MAXIMILIANO; CENCHA, LUISA; TINTE, SILVIA; URTEAGA, RAÚL; ARCE, ROBERTO D

Efficient approach for optical and morphological characterization of hybrid perovskite films based on reflectance and transmittance measurements

JOURNAL OF PHYSICS - D (APPLIED PHYSICS); Año: 2022 vol. 55

RODRÍGUEZ JIMÉNEZ, RAFAEL AURELIO; PANECATL BERNAL, YESMIN; CARRILLO LÓPEZ, JESÚS; MÉNDEZ ROJAS, MIGUEL ÁNGEL; ROMERO LÓPEZ, ANABEL; PACIO CASTILLO, MAURICIO; VIVALDO, ISRAEL; MORALES SÁNCHEZ, ALFREDO; ARCE, ROBERTO D.; CARAM, JORGE; VILLANUEVA?CAB, JULIO; ALVARADO, JOAQUÍN

Influence of Ethanolic Plant Extracts on Morphology and Size Distribution of Sol‐Gel Prepared TiO 2 Nanoparticles

ChemistrySelect; Año: 2021 vol. 6 p. 3958 - 3968

CARAM, JORGE; SENNO, MAXIMILIANO; CENCHA, LUISA; TINTE, SILVIA; URTEAGA, RAÚL; ARCE, ROBERTO D

Efficient approach for optical and morphological characterization of hybrid perovskite films based on reflectance and transmittance measurements

JOURNAL OF PHYSICS - D (APPLIED PHYSICS); Año: 2021 vol. 55

CARAM, J.; GARCÍA-BATLLE, M.; ALMORA, O.; ARCE, R. D.; GUERRERO, A.; GARCÍA-BELMONTE, G.

Direct Observation of Surface Polarization at Hybrid Perovskite/Au Interfaces by Transient Experiments

APPLIED PHYSICS LETTERS; Lugar: New York; Año: 2020

CARAM, JORGE; BUDINI, NICOLÁS; ARCE, ROBERTO DELIO

Analysis of substrate coverage of hybrid halide perovskite thin films deposited on glass

REVISTA MATéRIA; Año: 2018 vol. 23

F. GARCÉS; N. BUDINI; J. A. SCHMIDT; R. D. ARCE

Highly doped ZnO films deposited by spray-pyrolysis. Design parameters for optoelectronic applications

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2016 vol. 605 p. 149 - 156

F. GARCÉS; N. BUDINI; J. A. SCHMIDT; R. D. ARCE

Corrigendum to "Effect of thickness on structural and electrical properties of Al-doped ZnO films"[Thin Solid Films] 574 (2015) 162-168

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2015 vol. 589 p. 877 - 878

GARCÉS, F.; BUDINI, N.; ARCE, R. D.; SCHMIDT, J.A.

Effect of thickness on structural and electrical properties of Al-doped ZnO films

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2015 vol. 574 p. 162 - 168

GARCÉS, F.; BUDINI, N.; KOROPECKI, R. R.; ARCE, R. D.

Structural mosaicity and electrical properties of pyrolytic SnO2:F thin films

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2013 vol. 531 p. 172 - 178

LASAVE, L.C.; URTEAGA, R.; KOROPECKI, R. R.; GONZALEZ, V.; ARCE, R. D.

Real-time study of protein adsorption kinetics in porous silicon

COLLOIDS AND SURFACES B-BIOINTERFACES; Lugar: Amsterdam; Año: 2013 vol. 111 p. 354 - 359

PRIANO, G.; ACQUAROLI, L. N.; LASAVE, L.C.; F. BATTAGLINI; ARCE, R. D.; KOROPECKI, R. R.

Rationally Designed Porous Silicon As Platform For Optical Biosensors

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2012 vol. 550 p. 6434 - 6439

F. GARCÉS; L. N. ACQUAROLI; R. URTEAGA; A. DUSSSAN CUENCA; KOROPECKI, R. R.; ARCE, R. D.

Structural properties of porous silicon/SnO2: F heterostructures

THIN SOLID FILMS; Año: 2012 p. 4254 - 4258

BUDINI, N.; P. RINALDI; J. A. SCHMIDT; ARCE, R. D.; BUITRAGO, R.H.

Vacuum-enhanced nickel-induced crystallization of hydrogenated amorphous silicon

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 2012 vol. 112 p. 735061 - 735067

GARCÉS, F.; URTEAGA, R.; ACQUAROLI, L. N.; KOROPECKI, R. R.; ARCE, R. D.

Current-voltage characteristics in macroporous silicon/SiOx/SnO2:F heterojunctions

NANOSCALE RESEARCH LETTERS; Lugar: Berlin; Año: 2012 vol. 7 p. 419 - 425

J. A. SCHMIDT; N. BUDINI; R.H. BUITRAGO; R. D. ARCE

Polycrystalline silicon thin films on glass obtained by nickel-induced crystallization of amorphous silicon

Physica Status Solidi (c); Lugar: Weinheim, Germany; Año: 2011 vol. 7 p. 600 - 603

G.D. RUANO; J. FERRÓN; R. D. ARCE; R. R. KOROPECKI

Kinetics of electron induced desorption of hydrogen in nanostructured porous silicon

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE; Lugar: Hamburg; Año: 2011 vol. 208 p. 1453 - 1457

N. BUDINI; P. RINALDI; J. A. SCHMIDT; R.D. ARCE; R.H. BUITRAGO

Influence of microstructure and hydrogen concentration on amorphous silicon crystallization

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2010 vol. 518 p. 5349 - 5354

F. GARCÉS; L. N. ACQUAROLI; R. D. ARCE

Fabricación y caracterización de poros ordenados AL2O3 obtenidos por anodización electroquímica del aluminio

Revista SAM; Año: 2010 vol. 7 p. 19 - 26

L.C. LASAVE; G. PRIANO; R.R. KOROPECKI; F. BATTAGLINI; R. D. ARCE

Desarrollo de cristales fotónicos de silicio poroso para diagnóstico biomédico

FABICIB; Año: 2010 vol. 14 p. 70 - 83

Y. PUSEP; A. D. RODRIGUES; L.J.BORRERO-GONZALEZ; L.N. ACQUAROLI; R. URTEAGA; R. D. ARCE; R.R. KOROPECKI; M. TIRADO; D. COMEDI

Fano resonance in heavily doped porous silicon

Journal of Raman Spectroscopy; Año: 2010 vol. 42 p. 1405 - 1407

J.A. SCHMIDT; N. BUDINI; P. RINALDI; R.D. ARCE; R.H. BUITRAGO

Nickel-induced crystallization of amorphous silicon

Journal of Physics: Conference Series; Año: 2009 vol. 167 p. 120461 - 120464

L. N. ACQUAROLI; A. BRONDINO; J. A. SCHMIDT; R. D. ARCE; R.R. KOROPECKI

Infrared study of the oxidation of porous silicon: evidence of surface modes

Physica Status Solidi (c); Lugar: Weinheim, Germany; Año: 2009 vol. 6 p. 1111 - 1114

Y. PUSEP; A. D. RODRIGUES; J. C. GALZERANI; R. D. ARCE; R.R. KOROPECKI; D. COMEDI

Internal strain distribution in free-standing porous silicon

JOURNAL OF THE ELECTROCHEMICAL SOCIETY; Lugar: New York; Año: 2009 vol. 156 p. 215 - 217

J.A. SCHMIDT; C. LONGEAUD; R.R. KOROPECKI; R.D. ARCE; J.P. KLEIDER

Modulated photoconductivity in the high and low frequency regimes

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 2008 vol. 354 p. 2914 - 2917

PALACIOS, W.; KOROPECKI, R.R.; ARCE, R.D.; BUSSO, A.

Hydrogen isotopic substitution experiments in nanostructured porous silicon

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2008 vol. 516 p. 3729 - 3734

J.A. SCHMIDT; N. BUDINI; P. RINALDI; R.D. ARCE; R.H. BUITRAGO

Large-grained oriented polycrystalline silicon thin films prepared by nickel-silicide-induced crystallization

JOURNAL OF CRYSTAL GROWTH; Lugar: Amsterdam; Año: 2008 vol. 311 p. 54 - 58

BUITRAGO, R.H.; RISSO, G.; CUTRERA, M.; BATTIONI, M.; DE BERNARDEZ, L; SCHMIDT, J.; ARCE, R. D.; KOROPECKI, R. R.

Polycrystalline silicon thin film solar cells prepared by PE-CVD

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY; Lugar: Amsterdam; Año: 2008 vol. 33 p. 3522 - 3526

R. R. KOROPECKI; R.D. ARCE; C. SPIES; A. M. GENNARO; J. SCHMIDT

Role of hydrogen in photoinduced evolution of porous silicon photoluminescence

Physica Status Solidi C; Lugar: Weinheim; Año: 2007 vol. 4 p. 2150 - 2154

J. A. DUSSAN; R. ARCE; J. A. SCHMIDT; R. R. KOROPECKI

CARACTERIZACION OPTICA Y ELECTRICA DE PELICULAS DELGADAS SEMICONDUCTORAS DE SILICIO MICROCRISTALINO DOPADAS CON BORO

Revista Colombiana de Física; Lugar: Bogotá; Año: 2007 p. 99 - 102

J. A. SCHMIDT; C. LONGEAUD; R.R. KOROPECKI; R.D. ARCE

Low frequency modulated photoconductivity in semiconductorshaving multiple species of traps

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 2007 vol. 101 p. 103705 - 103715

D. COMEDI; S. PEREZ DE HELUANI; M. VILLAFUERTE; R. D. ARCE; R.R. KOROPECKI

Power law photoconductivity time decay in nanocrystalline TiO2 thin films

JOURNAL OF PHYSICS CONDENSED MATTER; Lugar: Bristol - United Kingdom; Año: 2007 vol. 19 p. 486205 - 486215

A. DUSSSAN CUENCA; R. R. KOROPECKI; R.D. ARCE; J.A. SCHMIDT

Structural and optical properties of compensated microcrystalline silicon films

REVISTA MEXICANA DE FíSICA; Lugar: Mexico; Año: 2007 vol. 53 p. 253 - 255

ARCE, R.D.; KOROPECKI, R.R.; OLMOS, G.; GENNARO, A.M.; SCHMIDT, J.A.

Photoinduced phenomena in nanostructured porous silicon

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2006 vol. 510 p. 159 - 164

R. KOROPECKI; R. D. ARCE; A. M. GENNARO; C. SPIES; J. A. SCHMIDT

Kinetics of the photoinduced evolution of the nanostructured porous silicon photoluminescence.

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 2006 p. 1163 - 1166

KOROPECKI, R.R.; ARCE, R.D.; SCHMIDT, J.

Infrared studies combined with hydrogen effusion experiments on nanostructured porous silicon.

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 2004 vol. 338 p. 159 - 162

DUSSAN, A.; SCHMIDT, J.A.; ARCE, R.D.; BUITRAGO, R.; KOROPECKI, R.R.

On the validity of defect density determinations by the recombination-regime modulated photoconductivity technique.

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2004 vol. 449 p. 180 - 186

DUSSAN, A.; KOROPECKI, R.R.; ARCE, R.D.; SCHMIDT, J.A.; BUITRAGO, R.H.

Post-growth annealing effects in compensated Ac-Si:H samples.

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 2004 vol. 338 p. 430 - 433

SCHMIDT, J.; KOROPECKI, R.R.; ARCE, R.D.; DUSSAN, A.; BUITRAGO, R.H.

Determination of the density of defect states by thermally stimulated conductivity studied from numerical simulations.

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 2004 vol. 338 p. 322 - 325

KOROPECKI, R.; ARCE, R.; SCHMIDT, J.A.

Photo-oxidation effects in porous silicon luminescence

PHYSICAL REVIEW B - CONDENSED MATTER AND MATERIALS PHYSICS; Año: 2004 vol. 69 p. 2053171 - 2053176

R.R. KOROPECKI; J.A. SCHMIDT; R. D. ARCE

Density of states in the gap of amorphous semiconductors determined from modulated photocurrent measurements in the recombination regime

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 2002 vol. 91 p. 8965 - 8969

SCHMIDT, J.A.; KOROPECKI, R.R.; ARCE, R.D.; RUBINELLI, F; BUITRAGO, R.H.

34. Energy-resolved photon flux dependence of the steady state photoconductivity in hydrogenated amorphous silicon: implications for the constant photocurrent method.

THIN SOLID FILMS; Lugar: Amsterdam; Año: 2000 vol. 376 p. 267 - 271

SCHMIDT, J.A.; ARCE, R. D.; KOROPECKI, R. R.; BUITRAGO, R.H.

Light-induced creation of metastable defects in hydrogenated amorphous silicon studied by computer simulations of constant photocurrent measurements

PHYSICAL REVIEW B - SOLID STATE; Lugar: New York; Año: 1999 vol. 59 p. 4568 - 4571

R. R. KOROPECKI; R. D. ARCE; R.H. BUITRAGO; C. BITTENCOURT; F. ALVAREZ

Condutivity dependence on thickness in thin film amorphous silicon-carbon alloys

THIN SOLID FILMS; Lugar: Amsterdam; Año: 1997 vol. 287 p. 295 - 299

J. A. SCHMIDT; R. D. ARCE; R.H. BUITRAGO; R.R. KOROPECKI

32. Light-induced defects in hydrogenated amorphous silicon studied by the constant photocurrent method

PHYSICAL REVIEW B - CONDENSED MATTER AND MATERIALS PHYSICS; Lugar: New York; Año: 1997 vol. 55 p. 9621 - 9627

J. A. SCHMIDT; CUTRERA, M.; BUITRAGO, R.H.; ARCE, R. D.

Influence of the light-induced degradation on the extended state mobility in hydrogenated amorphous silicon

APPLIED PHYSICS LETTERS; Lugar: New York; Año: 1996 vol. 69 p. 4047 - 4049

OCAMPO,E.; ARCE, R. D.; KOROPECKI, R. R.; BUITRAGO, R.H.

Effects of the carrier gas on properties of SnO2 deposited by pyrolysis

SOLAR ENERGY MATERIALS AND SOLAR CELLS; Año: 1995 vol. 36 p. 327 - 337

SCHMIDT, J.A.; KOROPECKI, R. R.; ARCE, R. D.; BUITRAGO, R.H.

Annealing‐induced effects on the stability of hydrogenated amorphous silicon

JOURNAL OF APPLIED PHYSICS; Año: 1995 p. 5959 - 5964

TEUSCHLER, T; HUNDHAUSEN, M.; LEY, L.; ARCE, R. D.

Analysis of random telegraph noise in large-area amorphous double-barrier structures

PHYSICAL REVIEW B; Año: 1993 vol. 47 p. 12687 - 12695

R.D. ARCE; R.R. KOROPECKI; M. CUTRERA; R. BUITRAGO

EFFECT OF THE DEPOSITION VARIABLES ON AMORPHOUS SILICON STABILITY

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 1993 vol. 164 p. 259 - 262

R.R. KOROPECKI; F. ALVAREZ; R.D. ARCE

Reply to “Comment on ‘Infrared study of the Si-H stretching band in a-SiC:H’ ” [J. Appl. Phys. 69, 7805 (1991)]

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 1992 vol. 71 p. 4092 - 4093

KOROPECKI, R. R.; F. ALVAREZ; ARCE, R.D.

Infrared Study of the Si-H Stretching Band in a-SiC:H.

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 1991 vol. 69 p. 7805 - 7810

B. GOTTLIEB; R.R. KOROPECKI; R.D. ARCE; R. CRISALLE; J. FERRÓN

CHARACTERIZATION OF FLUORINE-DOPED TIN OXIDE PRODUCED BY THE PYROSOL METHOD

THIN SOLID FILMS; Lugar: Amsterdam; Año: 1991 vol. 199 p. 13 - 21

J. FERRÓN; R.D. ARCE

ANOMALOUS INCORPORATION OF FLUORINE IN TIN OXIDE FILMS PRODUCED WITH THE PYROSOL METHOD

THIN SOLID FILMS; Lugar: Amsterdam; Año: 1991 vol. 204 p. 405 - 411

ARCE, R. D.; LEY, L.; HUNDHAUSEN, M.

Random telegraphic noise in large area a-Si:H/a-Si1−xNx:H double barrier structures

JOURNAL OF NON-CRYSTALLINE SOLIDS; Año: 1989 vol. 114 p. 696 - 697

R.D. ARCE; R.R. KOROPECKI; R.H. BUITRAGO

Direct evidence of porosity in carbonrich hydrogenated amorphous silicon carbide films

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 1989 vol. 66 p. 4544 - 4546

J. FERRÓN; R.R. KOROPECKI; R.D. ARCE

a-Si thin-filtn growth by sputtering: A Monte Carlo study

PHYSICAL REVIEW B - SOLID STATE; Lugar: New York; Año: 1987 vol. 35 p. 7611 - 7617

R. VIDAL; R. R. KOROPECKI; R.D. ARCE; J. FERRÓN

The first stages of oxidation of a .. Si studied with Auger electron spectroscopy

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 1987 vol. 62 p. 1054 - 1058

R.D. ARCE; R.R. KOROPECKI

Infrared Study of the Kinetics of Oxidation in Porous Amorphous Silicon

JOURNAL OF APPLIED PHYSICS; Lugar: New York; Año: 1986 vol. 60 p. 1802 - 1808

CUTRERA, M.; GENNARO, A. M.; BATTIONI, M.; KOROPECKI, R. R.; DE BERNARDEZ, L; ARCE, R. D.; BUITRAGO, R.H.

The Role of Surface in Sputtered Amorphous Silicon. An Oxidation Study

JOURNAL OF APPLIED PHYSICS; Año: 1985 vol. 58 p. 4251 - 4255

R.R. KOROPECKI; R.D. ARCE; J. FERRÓN

OXYGEN DEPTH PROFILING OF HIGH PRESSURE DC-SPUTI’ERED AMORPHOUS SILICON

APPLIED SURFACE SCIENCE; Lugar: Amsterdam; Año: 1985 vol. 25 p. 321 - 326

KOROPECKI, R. R.; DE BERNARDEZ, L; ARCE, R. D.; BUITRAGO, R.H.

Oxidation Mechanism in High Pressure dc-Sputtered Amorphous Silicon.

JOURNAL OF NON-CRYSTALLINE SOLIDS; Lugar: Amsterdam; Año: 1985 vol. 74 p. 11 - 17

R. CALVO; M. MESA; G. OLIVA; J. ZUKERMAN-SCHPECTOR; O. NASCIMENTO; M. TOVAR; R.D. ARCE

Structural and Magnetic Properties of Cooper Aminoacid Salt: Cooper (II)Bis (a-Amino Isobutyrate).

JOURNAL OF CHEMICAL PHYSICS; Año: 1984 vol. 81 p. 4584 - 4591

R.D. ARCE; F. DE LA CRUZ; J. GUIMPEL

Superconducting Behavior of Amorphous Zr Cu

SOLID STATE COMMUNICATIONS; Año: 1983 vol. 47 p. 885 - 887

R.D. ARCE; L. CIVALE; J. LUZURIAGA; J. GUIMPEL; F. DE LA CRUZ

Surface normal regions in superconducting Zr70Cu30 induced by thermal relaxation

SOLID STATE COMMUNICATIONS; Año: 1983 vol. 48 p. 1027 - 1030

S. OSEROFF; M. MESA; M. TOVAR; R.D. ARCE

Time Dependence Magnetization and ESR in AgMn Spin Glass

PHYSICAL REVIEW B; Año: 1983 vol. 27 p. 566 - 568

R.D. ARCE; F. DE LA CRUZ; J. GUIMPEL

SUPERCONDUCTING BEHAVIOR OF AMORPHOUS ZrCu

SOLID STATE COMMUNICATIONS; Lugar: Amsterdam; Año: 1983 vol. 47 p. 885 - 887

S. OSEROFF; M. MESA; M. TOVAR; R.D. ARCE

Time and Field Dependence of the Magnetization in AuFe, AgMn and ThGd Spin Glasses.

JOURNAL OF APPLIED PHYSICS; Año: 1982 vol. 53 p. 2208 - 2210

R. D. ARCE; F. DE LA CRUZ; H. FINK

Model Relating Superconducting Penetration Depth and Metallurgical Phase Separation in Amorphous La70Cu30

SOLID STATE COMMUNICATIONS; Año: 1982 vol. 42 p. 575 - 577

M. TOVAR; R. D. ARCE

Low Field dc-Susceptibility of ThGd Alloys

PHYSICA B - CONDENSED MATTER; Año: 1981 vol. 107 p. 639 - 641

R.D. ARCE; F. DE LA CRUZ; P. ESQUINAZI

Superconducting penetration depth in amorphous La70 Cu30

PHYSICA B - CONDENSED MATTER; Año: 1981 vol. 108 p. 1253 - 1254

R.D. ARCE; F. DE LA CRUZ; P. ESQUINAZI

Superconducting penetration depth in amorphous metals

SOLID STATE COMMUNICATIONS; Año: 1981 vol. 38 p. 1253 - 1255