INTECIN   20395
INSTITUTO DE TECNOLOGIAS Y CIENCIAS DE LA INGENIERIA "HILARIO FERNANDEZ LONG"
Unidad Ejecutora - UE
artículos
Título:
SnSb2Te4: Microcrystalline sample vs thin film
Autor/es:
ARCONDO, B.; UREÑA, M.A.; BILOVOL, V.; DI LISCIA, E.J.; ROCCA, J.A.
Revista:
JOURNAL OF SOLID STATE CHEMISTRY
Editorial:
ACADEMIC PRESS INC ELSEVIER SCIENCE
Referencias:
Año: 2020 vol. 285
ISSN:
0022-4596
Resumen:
SnSb2Te4, an intermetallic compound in the pseudobinary SnTe-Sb2Te3 system, looks like a promising candidate as a phase-change material for non-volatile memories applications. As made thin film grown by pulsed laser deposition, ablating a layered trigonal lattice SnSb2Te4 target (R-3m space group), resulted in a highly crystalline sample as it was deduced from conventional XRD measurements in grazing incidence. The crystalline phase was identified as the one with NaCl-type lattice (Fm-3m). The cubic phase transitioned to a trigonal structure when temperature (T) was raised and a change in resistance (R) was measured. During R vs. T measurements, a semiconductor behavior was observed for as made state, and after the thermal cycle, the final R-3m phase (on cooling) evidenced a metallic behavior. The structural modifications were verified by Raman spectroscopy and differential scanning calorimetry. 119mSn Möβbauer spectroscopy shed light on Sn environment in both powdered and film samples.