INVESTIGADORES
MONTEMARTINI pablo Ezequiel
artículos
Título:
CONCENTRATION DEPTH PROFILES IN FLUORINATED NETWORKS BY ELECTRIC FORCE MICROSCOPY
Autor/es:
LUIS A. MICCIO; MOHAMED M. KUMMALI; PABLO E. MONTEMARTINI; PATRICIA A. OYANGUREN; GUSTAVO SCHWARTZ; ANGEL ALEGRÍA; JUAN COLMENERO
Revista:
JOURNAL OF CHEMICAL PHYSICS
Editorial:
AMER INST PHYSICS
Referencias:
Lugar: New York; Año: 2011 p. 64704 - 64704
ISSN:
0021-9606
Resumen:
By means of Electric Force Microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30nm to 80nm in the near surface area for samples containing from 0.5 to 5 wt% F, respectively. In contrast, no gradients of concentration were detected in bulk. This new method has several advantages over other techniques because allows profiling directly on a sectional cut of the sample. By combining the obtained results with XPS measurements we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.
