Collision of two interfaces of different roughness: A numerical study.

E. V. ALBANO; I. M. IRURZUN

JOURNAL OF PHYSICS. A - MATHEMATICAL AND GENERAL

Institute of Physics

Año: 2001 vol. 34 p. 9631 - 9639

0305-4470

Abstract. In the classical Eden model (EM) the growing sites have the same probability of becoming occupied and the growing process in (1+1) dimensions leads to the formation of a self-affine aggregate with a growing exponent âEM = 1/3 and a roughness exponent áEM = 1/2. A generalization of the EM is proposed and studied, such that the growing probability now depends on the distance to the interface. This new model is called the unstable Eden model (UEM) because, within the short time regime, it exhibits an unstable growth mode with a growing exponent âUEM>1/2. However, in the asymptotic time regime the interface becomes stabilized and a roughness exponent áUEM = 1 can be defined. In contrast to the EM, the interface of the UEM is no longer self-affine. Based on extensive numerical simulations it is concluded that the interface generated by the collision between the EM and the UEM is characterized by a roughness exponent ácoll = áUEM = 1.