Effects of the chelating agent on the fabrication of SBT thin films: Part II. Microstructural and ferroelectric properties

A FRATTINI,; R MACHADO,; ML SANTIAGO,; N PELLEGRI,; M STACHIOTTI,; R. E. BOLMARO; O DE SANCTIS,

Foz do Iguaçu

Congreso; 11th International Meeting on Ferroelectricity; 2005

The effects of the chelating agent on the micro structural properties of SBT thin films annealed at different temperatures are investigated. The films were prepared on Pt/Ti/SiO2/Si substrates by a chemical solution deposition technique. Strontium acetate, bismuth nitrate and tantalum ethoxide were used as precursor materials, with methanol and glacial acetic as solvents. We make a comparative investigation of the surface microstructure, grain size distribution, crystallinity, and degree of crystal orientation for films prepared using acetoin and alkanolamines as chelating agent.