Recrystallization textures in FCC materials: A simulation based on micromechanical modeling data

RAUL EDUARDO BOLMARO; A ROATTA,; A FOURTY,; W SIGNORELLI, J

SCRIPTA MATERIALIA

Elsevier

Año: 2005 vol. 53 p. 147 - 152

1359-6462

The current paper approaches the problem of recrystallization (RX) textures by using Self-Consistent homogeneization simulation techniques, for both low and high stacking fault energy FCC materials. Stored energies and grain misorientations are outputs of the model allowing dealing with grain growth and grain boundary mobility and further simulating RX textures.