Poster: Characterization of Ti/TiO2 and Ti/TiO2/Ag/Co films by KPFM and SEM

FARIAS, E.D.; AVALLE, L.B.; PASSEGGI (JR.), M.C.G.

La Falda (Córdoba), 14-18 Mayo

Congreso; SAMIC2018, 5to Congreso Argentino de Microscopía; 2018

Sociedad Argentina de Microscopía

We studied the deposition of Ag and Ag-Co on Ti/TiO2 samples by Kelvin Probe Force Microscopy (KPFM) under ambient pressure and temperature conditions. The Ag and Co NP´s were either spontaneously formed or electrodeposited onto Ti/TiO2 samples. KPFM proved to be a useful tool to characterize changes in the substrate work function (WF) after they were modified. Studies by SEM and EPMA were also carried out for the same samples. By EPMA it could be demonstrated for TiO2/Ag samples, that the observed NP´s indeed correspond to Ag. In the TiO2/Ag-Co case, it seems that the NP´s amount was below the detection limit of the technique.Expuso: AVALLE, L.B.