Analysis of small deflections by double-exposure digital holographic interferometry

N. BUDINI; C. MULONE; F. M. VINCITORIO; A. J. LÓPEZ; A. RAMIL

IEEE LATIN AMERICA TRANSACTIONS

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Lugar: New York; Año: 2014 p. 428 - 432

1548-0992

We analyzed small deflections (~1 μm) of an opaque object by means of the double-exposure digital holographic interferometry technique, using an off-axis lensless Fourier holographic arrangement. The deflections were caused by heating the object with a flowing dc current. In our holographic arrangement, out-of-plane displacements of around 300 nm can be precisely detected by using a He-Ne laser as the coherent illumination source. However, this resolution could be improved by modifying the experimental setup or even choosing an appropriate object reference state. We briefly show the theoretical description of the technique and conduct experiments and simulations to test the results. Since the object we have studied in this work is a bimetallic strip, the obtained results point towards further research concerning precise temperature sensing devices.