Analysis of line profiles from transient plasmas using a pseudo-Fano function

C. A. D?ANGELO; D.M. DÍAZ PACE; G. BÁEZ; H.O. DI ROCCO

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

PERGAMON-ELSEVIER SCIENCE LTD

Lugar: Amsterdam; Año: 2017 vol. 135 p. 73 - 81

0584-8547

In this paper, a method for analysis of spectral line profiles is presented. The method is based on computing the emission line profiles and matching them to the measured ones. Within the developed approach, the evaluation of a Voigt convolution integral for each wavelength (or frequency) is circumvented by constructing an analytical formula, based in Fano function, that accounts for the different effects occurring in plasma sources, namely, background due to the continuum, saturation, self-absorption, self-reversal, asymmetry, line shift, and noise, which determine the spectral features observed in line profiles. Moreover, the emissivity profiles corresponding to the optically thin condition can be retrieved. To check its validity, the method was applied for the determination of the relative gA values of six Co I lines measured from Laser induced breakdown spectroscopy (LIBS). The results were compared with the tabulated values from the NIST database.