INTECIN   20395
INSTITUTO DE TECNOLOGIAS Y CIENCIAS DE LA INGENIERIA "HILARIO FERNANDEZ LONG"
Unidad Ejecutora - UE
congresos y reuniones científicas
Título:
Electrical characterization of thin film chalcogenide glasses for gas sensors
Autor/es:
RODRIGUEZ CUELLAR, O.; CONDE GARRIDO, J.; MARIA ANDREA UREÑA; ESCOBAR, ANA; SILVEYRA, J. M.
Lugar:
Saint Malo
Reunión:
Conferencia; PNCS-ESG2018 15th International Conference on the Physics of Non-Crystalline Solids - European Society of Glass; 2018
Resumen:
Among the several applications that chalcogenide glasses have, one of the most recent ones is their use as sensitive materials for the detection of gases. Although many materials have been successfully tested as sensitive membrane for gas sensors, chalcogenide glasses have the advantage of not requiring high temperatures for the detection of gasses. Tellurium based membranes were the subject of many investigations during the last decade [1], but other chalcogenide systems are being studied as well [2,3].In this work, we studied the electrical properties of GeTe, SeTe and GeSe3 thin film glasses deposited by pulsed laser deposition (PLD). We measured the conductivity of the films by DC measurements as a function of the temperature. On account of these results, in future work, we will study whether the addition of other elements to the membrane will improve the electrical response of the sensor.[1] D. Tsiulyanu, M. Ciobanu, Impedance Characterization of Gas Sensitive S-Te Based Quaternary Chalcogenides, 3rd International Conference on Nanotechnologies and Biomedical Engineering pp 382-388, DOI: 10.1007/978-981-287-736-9_92[2] V. Georgieva, Tz. Yordanov, V. Pamukchieva, D. Arsova, V. Gadjanova, and L. Vergovless, Gas Sensing Properties of Ge‐As‐S Thin Films, AIP Conference Proceedings 1203, 1079 (2010); DOI: http://dx.doi.org/10.1063/1.3322314[3] Ping Chen, Maria Mitkova, Dmitri A. Tenne, Kasandra Wolf, Velichka Georgieva, Lazar Vergov, Study of the sorption properties of Ge20Se80 thin films for NO2 gas sensing, Thin Solid Films, Volume 525, 15 December 2012, Pages 141-147, ISSN 0040-6090, DOI: http://dx.doi.org/10.1016/j.tsf.2012.09.077.