Raman spectroscopy of GeSe and AgGeSe thin films

J.M. CONDE-GARRIDO; .A. PIARRISTEGUY; R. LE PARC; M.A. UREÑA; M. FONTANA; B. ARCONDO; A.PRADEL

Brasov

Conferencia; 6 International Conference Amorphous and Nanostructured Chalcogenides (ANC 6); 2013

The structural properties of Agx(Ge0.25Se0.75)100-x thin films (where x=0, 7, 10, 15, 20 and 25 at. %) were studied. The films were prepared by pulsed laser deposition using bulk glasses target of the studied ternary system and deposited onto microscope slides. Their amorphous structures were confirmed by XRD (X-ray Diffraction). The effect of silver content on films structures have been analysed by Raman spectroscopy. Typical Raman vibration modes were observed in the Ge0.25Se0.75 binary film: Ge-Se corner-sharing tetrahedra mode (CS) at 199 cm-1, edge sharing tetrahedra mode (ES) at 217 cm-1, and Se-Se mode at 255  cm-1. In the Agx(Ge0.25Se0.75)100-x ternary thin films, the same modes were observed but with a red shift. Also, an intensity reduction of the ES and Se-Se bands are observed with silver content.  In a previous work [1], morphology and optical properties of the films were studied. Refractive index and the optical band gap energy were determined. A decrease in the optical band gap and an increase in the refractive index were observed with Ag content. Structural studies are applied with the aim to explain the optical behaviour.    References [1] J.M. Conde Garrido, A. Piarristeguy, M.A. Ureña, M. Fontana, B.Arcondo, A.Pradel, ?Compositional dependence of the optical properties of chalcogenide glasses thin film of Agx(Ge0.25Se0.75)100-x system? Journal of Non-Crystalline Solids (in press).