IFEG   20353
INSTITUTO DE FISICA ENRIQUE GAVIOLA
Unidad Ejecutora - UE
congresos y reuniones científicas
Título:
Analytical capabilities and applications developed at the IAEA multi-purpose X-ray spectrometry end-station at the XRF beamline of Elettra Sincrotrone Trieste
Autor/es:
M. CZYZYCKI; M. BOGOVAC; J. OSAN; R. KAISER; A. MIGLIORI; N. VAKULA; D. GANGADHAR; JUAN JOSÉ LEANI; PAWEL WROBEL; M TIWARI; A. KARYDAS
Lugar:
Gotemburgo
Reunión:
Congreso; European Conference on X-Ray Spectrometry (EXRS); 2016
Institución organizadora:
University of Gothenburg
Resumen:
The International Atomic Energy Agency (IAEA) operates jointly with Elettra Sincrotrone Trieste, Italy a multi-purpose X-ray spectrometry facility at the X-ray fluorescence (XRF) bending magnet beamline [1]. Exciting energies from 3.65 - 14.5 keV are currently available using a Si(111) double crystal monochromator with a resolving power of 1.5∙10-4 [2], whereas certain upgrades are foreseen for the near future.The synchrotron beamline end-station was developed to operate primarily under ultra-high vacuum (UHV) conditions, but non-UHV compatible samples can be also accommodated. The main instrument of the end-station is a motorized 7-axis manipulator, allowing 3 linear translations (x/y/z) and 2 rotational (theta/phi) movements of the sample. A coupled theta-2theta goniometer offers the option for performing simultaneously grazing incidence XRF (GI-XRF) and X-ray reflectometry (XRR) scans. An ultra-thin window silicon drift detector is employed for XRF experiments, whereas the direct incident and reflected beams can be detected by different photodiodes mounted on a linear stage. An intuitive control software based on LabVIEW environment allows the operation of all UHV instrumentation. The end-station is based on a prototype designed by the Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany and the Technical University of Berlin, Germany (TUB) [3].First results from inter-disciplinary applications of GI-XRF/XRR and total reflection mode X-ray absorption spectrometry for the characterization of various nano-structured materials, biological [4] and environmental samples [5] will be presented and discussed to highlight the analytical merits and capabilities of this new X-ray spectrometry facility.