CONICET | Buscador de Institutos y Recursos Humanos

In the present work we propose a method for simplifying the calibration procedure of confocal μXRF experiments for surface analysis. It was motivated by the complexity of the analytical description of the primary x-ray fluorescence intensity proper of this geometry. As a new strategy we introduces the application of the convolution theorem to the theoretical formalism based on the fundamental parameters. Thus, we proved that the Fourier Transform of a the linear scan of the x-ray fluorescence emission through a normal direction of a standard foil can be used to obtain the sensitivity of the confocal geometry. Analytical expressions for sensitivity parameters were derived for monochromatic and polychromatic sources. They give a fast and simple way to evaluate the sensitivity of the confocal geometry, which is very useful during in alignment processes.