Sub-pixel straight lines detection for measuring through machine vision

ANA GEORGINA FLESIA; GUILLERMO BERGUES; GUILLERMO AMES; C. SCHURRER; LUIS CANALI

Montevideo

Conferencia; 2014 IEEE international Instrumentation and Measurement technology conference; 2014

IEEE

Abstract?External visual interfaces for high precision measuring devices are based on the segmentation of images of their measuring reticle. In this paper, a method for subpixel straight lines detection is presented and tested on images taken from the reticule of a dark field autocollimator. The method has three steps, the sharpening of the image using a version of the Savitzky- Golay filter for smoothing and differentiation, the construction of a coarse edge image using Sobel filters, and finally, the subpixel edge location determination, by fitting a Gaussian function to orthogonal sections of the coarse edge image.We discuss results of applying the proposed method to images of the reticle of a Nikon 6D autocollimator, using the scale of the device as a benchmark for testing the error in the location of the lines and compare them with Sobel/Hough and Sobel/polynomial fitting. We report that for this type of image-content, Gaussian fitting has smaller uncertainty, when cameras with two different sensors are used.