IFEG 20353
INSTITUTO DE FISICA ENRIQUE GAVIOLA
Unidad Ejecutora - UE
artículos
Título:
Testing digital low-pass filters using oscillation-based test
Autor/es:
G. PERETTI; E. ROMERO; C. MARQUÉS
Revista:
MICROPROCESSORS AND MICROSYSTEMS
Referencias:
Año: 2008 vol. 32 p. 1 - 9
ISSN:
0141-9331
Resumen:
In this paper, we propose a novel low-cost BIST scheme for testing low-pass FIR and IIR filters, based on the oscillation-based test(OBT). The OBTBIST scheme developed here avoids test-pattern generation and tests the filter at-speed, without test-point insertion.We employ a systematic procedure for designing the oscillator and for obtaining the oscillation conditions in advance. The simulationresults show high fault coverage for the filters under test, with low area overhead and acceptable test time.
