IFEG   20353
INSTITUTO DE FISICA ENRIQUE GAVIOLA
Unidad Ejecutora - UE
artículos
Título:
Structural and elemental X-ray microanalysis with synchrotron radiation in confocal geometry
Autor/es:
SOSA, C.; PEREZ, C.A.; H.J. SÁNCHEZ; PEREZ, R.D.
Revista:
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH B - BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Editorial:
ELSEVIER SCIENCE BV
Referencias:
Lugar: Amsterdam; Año: 2014 vol. 319 p. 171 - 176
ISSN:
0168-583X
Resumen:
A spectrometer for 3D structural and multielemental X-ray microanalysis with synchrotron radiation is
presented in this work. It is based on the combination of the energy dispersive X-ray fluorescence and
diffraction with polycapillary optics. The 3D spatial resolution was achieved by the superposition of
the foci of two lenses arranged in confocal geometry. The parameters that affect the performance of
the spectrometer were study in detail giving rise to a simplified calibration method for depth profile analysis.
Two specific examples were included to illustrate the use of the spectrometer in order to identify
their possible application fields.