IFEG   20353
INSTITUTO DE FISICA ENRIQUE GAVIOLA
Unidad Ejecutora - UE
artículos
Título:
Calibration method for confocal x-ray microanalysis with polychromatic excitation
Autor/es:
PEREZ, R.D; SOSA, C.; H.J. SÁNCHEZ; V. SBARATO; LEANI J.; C.A.. PÉREZ
Revista:
Activity Report/Brazilian Synchrotron Light Laboratory
Editorial:
Brazilian Synchrotron Light Laboratory
Referencias:
Lugar: Campinas; Año: 2012 vol. 2011 p. 1 - 2
ISSN:
1518-0204
Resumen:
As in any other analytical technique, the first step for the application of the confocal XRF is the calibration of the spectrometer. The goal is the measurement of the spectrometer sensitivity, it means, the determination of a spatial and energy function which relates the elemental concentration with the detected XRF. Theoretical description of the confocal sensitivity using fundamental parameters was presented in the literature. When it is applied for polychromatic excitation the influence of the excitation lens in the XRF intensity is more pronounced, since their focalization properties for all energies present in the incident beam must be considered to evaluate the XRF intensity. Therefore, a detailed characterization of the excitation lens is required for the calibration of the confocal setup.