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Dear Prof. Héctor Jorge Sánchez We are pleased to let you know that your JAAS article ´THEORETICAL CALCULATIONS OF THE INFLUENCE OF RESONANT RAMAN SCATTERING ON THE QUANTIFICATION OF XRF SPECTROCHEMICAL ANALYSIS´ has been passed to our Editorial Production department. It has been assigned a production reference number of C1JA10219B. All correspondence regarding your paper post-acceptance should be addressed to the Editorial Production department (jaas@rsc.org) and quote this reference number. You can correctly reference this article in any related papers before page numbers have been assigned. The reference should be in the form: J. Anal. At. Spectrom., DOI:10.1039/C1JA10219B. PDF proofs for correction will be sent to you by e-mail in due course. Please note that authors are responsible for the final proof-reading of manuscripts. It is imperative that you check your proofs (including any tabulated data and figures) very carefully. Proof corrections will need to be returned to the Editorial Production office within 48 hours of receipt. All corrections should be sent at the same time. Papers are published as Advance Articles on the web as soon as possible after we receive proof corrections from the authors. Late corrections cannot be incorporated after publication of the Advanced Article. Best wishes RSC PublishingRoyal Society of Chemistry, Thomas Graham House,Science Park, Cambridge, CB4 0WF, UKE-mail: jaas@rsc.orgWebsite: http://www.rsc.org and http://www.chemsoc.orgDOI:10.1039/C1JA10219B.In this work we present theoretical calculations of the resonant Raman scattering contributions to the background of X-ray fluorescence spectra. The main goal of the paper is to obtain a simple and reliable procedure to calculate the influence of RRS in spectrochemical analysis by x-ray fluorescence including second order enhancements processes. In order to perform the calculations, the Shirawa and Fujino model was used to calculate the characteristic intensities of the different atomic processes involved. In the case of polychromatic excitation over a multi-element sample of proximate atomic numbers, the calculations show that the contribution of RRS is higher than Compton scattering but lower then coherent scattering, being this last process the most important source of background in the range of the fluorescent lines. The calculated effects of enhancements are rather low and have influence only on the lightest elements of the spectra. On the other hand, the resonant Raman scattering line interferes with fluorescent peaks in the case of monochromatic excitation when elements of proximate atomic numbers are analyzed (for example Al-Si). The model proposed here allows analyzing the different sources of background, which contribute to a better understanding of the physical processes involved in the different techniques of XRF analysis. In addition, the calculations presented here can contribute significantly to a more precise quantification of traces and minor components.