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This paper studies the effect of Analog Single-Event Transients (ASETs) in OTA-C structures.By adopting an ASET modelpreviously reported and fully compatible with SPICE descriptions,a simulation campaign is carried out in an OTA-Clow-pass filter taken as a case study. The results of this campaign show that the structure of the circuit under studypresents a high sensibility to ASETs. Consequently, the use of this circuit should be avoided in systems that operatein environments with heavy ions, unless techniques such as fault tolerance or radiation hardening were used. Thestudy also identifies the most sensitive transistors that should be hardenedin order to improve the behavior at thesystem level.