Preparation and characterization of ZnFeO thin films

A. EL MANOUNI; R. CASASUS; M. MOLLAR; L. C. DAMONTE; B. MARI

Strasbourgh, France

Simposio; European Materials Research Symposium; 2009

Zn1-xFexO ternary thin films were electrodeposited from electrolytes containing Fe (II) and Fe (III) perchlorate precursors in dimethylsulfoxide.  The Fe molar fraction in the starting electrolytes ranged between 0 and 69%. Films were deposited onto ITO/glass conductive substrates at 80ºC in presence of molecular O2 at deposition potentials ranging -0.9 to -0.7 volts. Any effect of the potential in the range 0.7-0.9V was observed. Electrodeposited films were analysed by energy dispersion spectroscopy (EDS), XRD, optical transmittance and reflectivity spectroscopies. EDS results confirm the incorporation of iron in Zn1-xFexO films and the Fe final content x increase linearly as the initial Fe/Zn ratio in starting solution increases. XRD diffraction analysis confirms the formation of the host ZnO with the wurtzite structure only at low Fe final content x. The optical transmittance spectra show a high transmittance around 85% in visible region and a deformation of absorption edge whose became more net as the Fe concentration increase. The optical reflectivity spectra allow us to esteem the thickness of films which is ranging 280 to 730 nm.