XANES study of pure and Fe-doped TiO2 and SnO2 films

A.M. MUDARRA NAVARRO, F. GOLMAR, C.E. RODRÍGUEZ TORRES, L. A. ERRICO, A.F. CABRERA, M. RENTERÍA, AND F.H. SÁNCHEZ

Campinas, Brasil.

Congreso; XVIII Reunión Anual de Usuarios del LNLS (XVIII RAU), LNLS, Campinas, Brasil. 18-19 de Febrero de 2008.; 2008

Labaratorio Nacional de Luz Sincrotrón, Campinas, Brasil.

TiO2 and SnO2 semiconductor films, pure and doped with magnetic impurities, have been the subject of numerous studies due to their potential applications in spintronics and optoelectronic devices. In this work we present and electronic and structural study of pure and Fe-doped TiO2 and SnO2 thin films deposited on LaAlO3 by pulsed laser deposition (PLD). XANES were recorded at the O K-edge, Sn M-edge, Fe L- edge and/or Ti L-edge. TiO2 and SnO2 in powder and a palette of mettalic Fe were also measured for comparison. These spectra were recorded on the SGM beamline (LNLS) in total electron yield detection mode. We explored the influence of the impurity and the material nature (film or powder in the electronic and structural properties of the samples. The films were also characterized by X-ray diffraction, and SQUID magnetometry measurements.