IFLP   13074
INSTITUTO DE FISICA LA PLATA
Unidad Ejecutora - UE
congresos y reuniones científicas
Título:
Magnetic Behavior of Mn, Al doped ZnO Thin Films Obtained by PLD
Autor/es:
M. FURLANI; C. I. ZANDALAZIN; A. J. MORENO; M. I. OLIVA; G. PUNTE
Lugar:
Buenos Aires
Reunión:
Workshop; X Latin American Workshop on Magnetism, Magnetic Materials and their Applications.; 2013
Resumen:
Diferent thin films of diluted magnetic semiconductors, nanostructured zinc oxide-based materials were grown by PLD and deposited on a SiN substrate (Si < 100 >)/SiO2/Nitrilo). The processed samples from ceramic targets of diferent compositions,Zn1-x-yAlxMnyO, contain an equal concentration of aluminium, 3 % in weight, because it optimizes the value of resistivity ofsemiconductor and diferent concentrations of manganese. The samples were characterized by x-ray difraction. The chemical identification of the films constituents and their stoichiometry was obtained by ESCA electron spectroscopy and Augerspectroscopy, while the magnetic properties were explored through a MPMS-SQUID magnetometer. The XRD results enabled to determine the presence in all materials of zinc oxide with wurtzite crystal structure. In addition, several manganese oxides wereidentified in powders samples, while the presence of zinc oxide (wurtzite) only was detected in thin films, with preferential growth in the c direction perpendicular to the substrate. Determinations that were conducted show that the stoichiometry of thesurface maintains the stoichiometry of the target from which comes from. All films showed ferromagnetic behavior, even the one deposited without magnetic dopant, but the value of the saturation magnetization varies with the dopant concentration.
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