Spin reorientation in Al/Metglas 2605S2/Al trilayers induced by magnetoelastic effect

P. S. MOSCON, E. C. PASSAMANI, C. LARICA, A. Y. TAKEUCHI, F. H. SÁNCHEZ, P. MENDOZA ZÉLIS, AND ELISA BAGGIO-SAITOVITCH

JOURNAL OF APPLIED PHYSICS

AIP

Año: 2008 vol. 104 p. 539051 - 539056

0021-8979

Mössbauer spectroscopy, in a broad temperature interval of 12–425 K, has been applied toinvestigate the spin reorientation dynamics caused by the temperature induced magnetoelastic effect on Alx micrfons/Metglas 2605S2 20 microns /Alx microns trilayers x=0; 2.5; 5 and 20. It was found that the angle between the average sample magnetization and gamma ray direction (perpendicular to the sample plane) depends on the Al layer thickness. For temperatures smaller than 260 K, saturation of spin reorientation, which can be controlled by adjusting the Al thickness, was reached for Al thicknesses larger than and equal to 5 microns. For a 20 microns Al thickness, changes in the 57Fe atom spin and charge densities have also been observed. A simple spin model has been proposed to describe qualitatively the spin reorientation effect as well as the influence of the Al thickness on the spin reorientation sensitivity.