CEQUINOR   05415
CENTRO DE QUIMICA INORGANICA "DR. PEDRO J. AYMONINO"
Unidad Ejecutora - UE
artículos
Título:
Infrared reflectivity of Cox(SiO2)1-x (x~0.85, 0.55, 0.38) granular films on SiO2 glass substrates
Autor/es:
NÉSTOR E. MASSA; JULIANO C. DENARDIN; LEANDRO M. SOCOLOVSKY; MARCELO KNOBEL; FERNANDO PABLO DE LA CRUZ; XIANG X. ZHANG
Revista:
SOLID STATE COMMUNICATIONS
Editorial:
Elsevier
Referencias:
Lugar: New York; Año: 2007 vol. 141 p. 551 - 551
ISSN:
0038-1098
Resumen:
We report infrared specular reflectivity of Cox(SiO2)1-x (x~0.85, 0.55, 0.38)  films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x~0.85 show carrier metallic shielding and hopping conductivity, for x~0.65 and lower concentrations, the nanoparticles number and size promotes a localization edge near the highest longitudinal optical frequency. Such edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted  hopping, and polaron formation. Optical conductivity fits with current polaron models provide ground toward a microscopic understanding of transport properties in these as prepared granular films