INTEC 05402
INSTITUTO DE DESARROLLO TECNOLOGICO PARA LA INDUSTRIA QUIMICA
Unidad Ejecutora - UE
artículos
Título:
Infrared study of the oxidation of porous silicon: evidence of surface modes
Autor/es:
L. N. ACQUAROLI; A. BRONDINO; J. A. SCHMIDT; R. D. ARCE; R. R. KOROPECKI
Revista:
PHYSICA STATUS SOLIDI C
Editorial:
WILEY-VCH Verlag
Referencias:
Lugar: Weinheim; Año: 2009 vol. 6 p. 1546 - 1550
ISSN:
1862-6351
Resumen:
The evolution of FTIR spectra of PS during oxidation is studied in the range 450-1300 cm1. We show that the small scale of the PS structure leads to a significant scattering cross section for Fröhlich surface modes associated to stretching modes in siloxane bridges. The kinetics of the evolution of both bulk- and surface-related modes are studied using Principal Component Analysis. As a result, two independent components are found, one of them related to TO modes associated to silicon oxide covering large structures and the other one associated to the oxidation of a distribution of prolate ellipsoids with nanoscopic size.
