EIS characterization of oxides on titanium and zirconium compared with surface analysis

MARIA CECILIA FUERTES; SILVIA CERÉ; ANDREA GOMEZ SANCHEZ

A Toxa

Simposio; 10th International Symposium on Electrochemical impedance Spectroscopy; 2016

International Society of Electrochemistry (EIS)

The estimation of oxide layer structure and thickness from EIS results was used by many authors but is still matter of controversy1. The space charge influence on the EIS behaviour, the double layer capacitance and the unknown permitivity of the oxide film are some of the main critics to the thickness layer estimation. However, in some cases the thickness estimation with EIS is in good agreement with other surface analysis techniques, each having its own error sources. In this work, electrochemical impedance spectroscopy was performed in borax to evaluate the structure and thickness, compared to multitechnique characterization of well known sol gel films2 on the metallic substrates, with the aim of develop an analytical approach to extract effective capacitance from constant phase elements.In this work a fully characterised set of titanium oxide films were deposited on pure titanium by sol-gel and tested with electrochemical impedance spectroscopy in borax with the aim of evaluate the goodnees of the estimation of film thickness.